Nanores Laboratory organized a specialized training course for SBBE students. The training provided them an opportunity to be familiarized with the following instrumental methods: scanning electron microscopy (SEM), environmental scanning electron microscopy (ESEM), energy-dispersive X-ray spectroscopy (EDS), and focused ion beam (FIB) technology. The research was conducted using Helios NanoLab 600i, Helios 5 CXe PFIB, and Quanta 3D 200i microscopes. The course included both theoretical introductions and hands-on sessions covering sample preparation and the use of advanced equipment. Participants had the chance to conduct structural and elemental analysis for different samples and observe how FIB techniques can be used for precise material processing at the micrometer scale.